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化学 高校生

読みましたが、全体的に理解出来ません。英語で理解出来なかったので多分、全文和訳しても理解出来ません。 なので、この写真に載っていることを分かりやすく教えていただきたいです🙇🏻‍♀️

Free energy changes determine if a reaction is endothermic or exothermic. Processes in nature are driven in two directions: toward least MAIN IDEA enthalpy and toward greatest entropy. When these two oppose each other, the dominant factor determines th direction of change. As a way to predict which factor will dominate fora given system, a function has been defined to relate the enthalpy and entropy factors at a given temperature tropy and constant pressure. This combined enthalpy-entropy function is callepd t free energy, G, of the system; it is also called Gibbs free energy. This function simultaneously assesses the tendencies for enthalpy and entropy to change. Natural processes proceed in the direction that lowersthefree energy of a system. Only the change in free energy can be measured. It can be defined in terms of changes in enthalpy and entropy. At a constant pressure and temperature, the free-energy change, AG, of a system is defined as the difference between the change in enthalpy, AH, and the product of the Kelvin temperature and the entropy change, which is defined as TAS. Free Energy Change AGO= AH°- TASO Note that this expression is for substances in their standard states. The product TAS and the quantities AG and AHhave the same umor usually kJ. The units of AS for use in this equation are usually N If AG<0, the reaction is spontaneous. AH and AS in the free-energy equation can have positive or negative values. This leads to four possible combinations of terms.

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化学 高校生

RHEED法の原理と得られる7つの情報が、この英文に書かれているみたいなのですが、よく分かりません。 分かる方助けてください!🙇‍♂️

INTRODUCTION Reection high-energy electron diHiraction (RHEED) uses a Rnely collimated electron beam with energy of 10-100 keV. The beam irradiates a sample surface with gazing incidence to obtain forward scattered difraction patterms. RHEED enables us to analyze structures of crystal surfaces at atomic levels and also to in situ monitor growth processes of thin films (mo、1988: Ichimiya and Cohen、2004: Peng et al.. 2011). From the arrangement。intensity and profile of the dilraction spots in RHEED patterns as described below in detail、 one can obtain various kinds of information: (1) the periodicity (unit cells) in atomic arrangements. (2) flat- ness of surfaces. (3) sizes of grains/domains of surface structures and microcrystals grown on the surface. (3) epitaxial relation between the grown flms/islands with respect to the substrate. (5) parameters character- izing structural phase transitions. (6) individual atomic positions in the unit cells. and (7) growth styles of thin films and numbers of atomic layers grown. The most important advantages of the method are that it is quite easy to install the RHEED apparatus in Yarious types of vacuum chambers without interfering with other components of apparatuses and to do real- time monitoring during thin-Rlm growths. Because of these advantages.RHEED is nowwidelyusednotonlyin research Iabs of surfaces and thin fims. but also in device production processes in industry Low-energy electron diiraction (LEED、see article Low-ENNERcy ErecroN DirscmoN)。 in which an electron beam of 10-100 eV in energy is irradiated onto a sample surface with nearly normal incidence to obtain back- scattered difraction patterns. is also widely used to analyze the atomic structures of crystal surfaces. Since one has to make the sample face directly to the LEED

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